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SNJ54BCT8374AFK Datasheet, PDF

  • Manufacturer model: SNJ54BCT8374AFK
  • Function description: Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops
  • Manufacturer: Texas Instruments
  • Data sheet:
  • Category: General-purpose transceivers

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SNJ54BCT8374AFK Similar Part

  • SNJ54BCT8374AFK Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops Texas Instruments 33947 67.638
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  • SNJ54BCT8374AFKR BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, CQCC28, CERAMIC, CC-28 Texas Instruments 16053 0

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