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SN74BCT8374DWR Datasheet, PDF

  • Manufacturer model: SN74BCT8374DWR
  • Function description: Scan Test Devices With Octal D-Type Edge-Triggered Flip-Flops 24-SOIC 0 to 70
  • Manufacturer: Texas Instruments
  • Data sheet: -
  • Category: Bus Driver/Transceivers

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SN74BCT8374DWR Similar Part

  • SN74BCT8374DWR Scan Test Devices With Octal D-Type Edge-Triggered Flip-Flops 24-SOIC 0 to 70 Texas Instruments 8944 0
  • SN74BCT8374DWR Boundary Scan Bus Driver, BCT/FBT Series, 1-Func, 8-Bit, True Output, BICMOS, PDSO24, DSO-24 Rochester Electronics LLC 8946 0

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